Перегляд за автором "Lukienko, O.A."

Результати 1-5 з 5

Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method

Tkachenko, V.F.; Kryvonogov, S.I.; Budnikov, A.T.; Lukienko, O.A.; Vovk, E.A. (Functional Materials, 2014)

The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire ...
Structure perfection of bulk and near-surface layers in sapphire single crystals

Tkachenko, V.F.; Puzikov, V.M.; Dan`ko, A.Ya.; Budnikov, A.T.; Lukienko, O.A. (Functional Materials, 2007)

Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing ...
Structure perfection of sapphire single crystals grown by HOC method in reducing atmosphere

Tkachenko, V.F.; Lukienko, O.A.; Budnikov, A.T.; Vovk, E.A.; Krivonogov, S.I. (Functional Materials, 2011)
Study of nature of some defects visible in polarized light in sapphire signle crystals

Tkachenko, V.F.; Dan`ko, A.Ya.; Puzikov, V.M.; Budnikov, A.T.; Lukienko, O.A.; Sidelnikova, N.S.; Adonkin, G.T. (Functional Materials, 2007)

Using the precision technique of triple-crystal X-ray diffractometry, the structure of defect parts has been studied in large-size sapphire crystals grown by the horizontal directed crystallization in reducing gas media. ...
XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation

Tkachenko, V.F.; Lukienko, O.A.; Budnikov, A.T.; Vovk, E.A.; Krivonogov, S.I.; Dan`ko, A.Ya. (Functional Materials, 2011)

Результати 1-5 з 5

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Перегляд за автором "Lukienko, O.A."

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Перегляд за автором "Lukienko, O.A."

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